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Lam, Thomas

Fellowship Advisor Museum Conservation Institute staff

Materials characterization: specialized in microscopy, scanning electron microscopy, and microanalysis


Background And Education

Education And Training

Professional Biography

  • Thomas specializes in materials characterization on materials of cultural value.  Specifically, Thomas works on projects revolving around applying scanning electron microscopy energy dispersive spectroscopy (SEM-EDS), cathodoluminescence (CL), X-ray fluorescence (XRF), or microfade testing (MFT).

Awards And Honors

Public Biography

  • During his PhD, Thomas also worked at the National Energy Technology Laboratory (2008-2011). After his PhD, Thomas completed a postdoc at the National Institute of Standards and Technology (NIST). At NIST, Thomas worked on projects developing methodologies to visualize and characterize 3D nanostructures. Thomas was a Sr. Research Specialist at the Electron Microscopy Core Facility at the University of Missouri from 2014-2015. At the University of Missouri, he worked with the students and faculty to apply electron microscopy (SEM, SEM EDS, Electron Beam Lithography, TEM, STEM EDS, STEM EELS and EFTEM) research to their projects. Thomas joined the Smithsonian Museum Conservation Institute (MCI) in 2016.

Research And Grants


Selected Publications


  • Presentation

    • Lam, Thomas. 2023. Application of Centimeter Scale EDS and Micro-XRF Microanalysis Imaging in Cultural Heritage [presentation]. November 2, 2023. Columbia, Missouri: Central States Microscopy and Microanalysis Society.
    • Lam, Thomas, Vicenzi, Edward P., Smith, Susan N., and Devine, Scott. 2023. Color Analysis and Microfade Testing of the 1918 Curtiss Jenny US Airmail Stamp [presentation]. October 17, 2023. Washington, DC: National Postal Museum and Institute of Analytical Philately.