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EBIT Observation of Ar Dielectronic Recombination Lines near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters Article uri icon

Complete Citation

  • Gall, Amy C., Foster, Adam R., Silwal, Roshani, Dreiling, Joan M., Borovik, Alexander, Jr., Kilgore, Ethan, Ajello, Marco, Gillaspy, John D., Ralchenko, Yuri, and Takács, Endre. 2019. "EBIT Observation of Ar Dielectronic Recombination Lines near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters." The Astrophysical Journal 872:194. https://doi.org/10.3847/1538-4357/ab0177