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Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM Article uri icon

Complete Citation

  • Vicenzi, Edward P. and Lam, Thomas. 2019. "Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM." Microscopy and Microanalysis 25:2482-2483. https://doi.org/10.1017/S143192761901314X